Semiconductor devices. Micro-electromechanical devices - Test method for Poisson's ratio of thin film MEMS materials Ingestion-build-84997 Changes have been made to

Changes have been made to the values in some Tables

BS EN 2591-6314 guides you on the preparation of specimens and provides test methods for checking the sealing of optical connection elements and fibre optic couplers

commissioning and maintenance of systems in non-domestic premises

5 Quality conformance inspection

BS 5721 defines a weighting characteristic which is designated D for the above-mentioned purpose

Semiconductor devices. Micro-electromechanical devices - Test method for Poisson's ratio of thin film MEMS materials Ingestion-build-84997 Changes have been made to1 Scope This part of IEC 62047 specifies the determination of Poisson's ratio from the test results obtained by the application of uniaxial and biaxial loads to thin film micro electromechanical systems (MEMS) materials with lengths and widths less than 10 mm and thicknesses less than 10 m.